High-voltage semiconductor device and method of forming the same
AssigneeVanguard International Semiconductor Corporation
InventorsWen-Hsin Lin, Shin-Chen Lin, Yu-Hao Ho, Cheng-Tsung Wu, Chiu-Hao Chen
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AssigneeVanguard International Semiconductor Corporation
InventorsWen-Hsin Lin, Shin-Chen Lin, Yu-Hao Ho, Cheng-Tsung Wu, Chiu-Hao Chen
Estimating the term…
High-voltage semiconductor device and method of forming the same, the high-voltage semiconductor device includes a substrate, a gate structure, a drain, a first insulating structure and a drain doped region. The gate structure is disposed on the substrate. The drain is disposed in the substrate, at one side of the gate structure. The first insulating structure is disposed on the substrate, under the gate structure to partially overlap with the gate structure. The drain doped region is disposed in the substrate, under the drain and the first insulating structure, and the drain doped region includes a discontinuous bottom surface.
A high-voltage semiconductor device, comprising:
A method of forming a high-voltage semiconductor device, comprising:
Dependencies are inferred from the claim text.