Integrated circuit and test operation method thereof
AssigneeSK hynix Inc.
InventorSeung Hyun CHUNG
Life of this patent
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Abstract
An integrated circuit includes a test counting circuit, a test information storage circuit, a sequence control circuit and a driving circuit. The test counting circuit generates a counting address signal. The test information storage circuit stores a test control value and outputs the test control value based on the counting address signal. The sequence control circuit changes an output sequence of the test control value based on a sequence control signal and outputs a final test control value based on the test control value or a target control value. The driving circuit performs a pre-set test operation based on the final test control value.
Claims18
An integrated circuit comprising:
- a test counting circuit configured to generate a counting address signal;
- a test information storage circuit configured to store a test control value and output the test control value based on the counting address signal;
- a sequence control circuit configured to change an output sequence of the test control value based on a sequence control signal and configured to output a final test control value based on the test control value or a target control value;
- and
- a driving circuit configured to perform a pre-set test operation based on the final test control value.
A test operation method of an integrated circuit, the test operation method comprising:
- inputting change information for an output sequence of a final test control value for a test operation;
- generating, based on the output sequence, the final test control value from a test control value or a target control value;
- and
- performing a test on an integrated circuit based on the final test control value.
Dependencies are inferred from the claim text.