Testing circuit, testing device and testing method thereof
AssigneeChangxin Memory Technologies, Inc.
InventorLiang ZHANG
Life of this patent
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Abstract
A testing circuit includes: a first sampling module configured to receive a to-be-tested pulse signal, and generate a first sampled signal according to the pulse signal; and a second sampling module configured to receive the pulse signal, and generate a second sampled signal according to the pulse signal. The second sampled signal and the first sampled signal have a phase difference, the phase difference being equal to a pulse width of the pulse signal.
Claims20
A testing circuit, comprising:
- a first sampling module, configured to receive a to-be-tested pulse signal, and generate a first sampled signal according to the pulse signal;
- and
- a second sampling module, configured to receive the pulse signal, and generate a second sampled signal according to the pulse signal,
- wherein the second sampled signal and the first sampled signal have a phase difference, the phase difference being equal to a pulse width of the pulse signal.
A testing method performed by a testing device comprising a first sampling circuit, a second sampling circuit and an analysis circuit, the method comprising:
- receiving, by the first sampling circuit and the second sampling circuit, a to-be-tested pulse signal;
- generating, by the first sampling circuit and the second sampling circuit, a first sampled signal and a second sampled signal according to the pulse signal respectively;
- and
- obtaining, by the analysis circuit, the first sampled signal and the second sampled signal, and obtaining a width of the pulse signal according to the first sampled signal and the second sampled signal,
- wherein the second sampled signal and the first sampled signal have a phase difference, the phase difference being equal to a pulse width of the pulse signal.
Dependencies are inferred from the claim text.