Memory sub-system scan

A system, comprising:

• a memory device comprising a first group of memory cells and a second group of memory cells, wherein the first group of memory cells is indicated as having a different reliability characteristic than that of the second group;
• and
• a processing device, operatively coupled to the memory device, to:
• perform, to determine a reliability of the first group, a scan operation on the first group of memory cells at a first rate;
• and
• perform, to determine a reliability of the second group, a scan operation on the second group of memory cells at a second rate, wherein the first rate is higher than the second rate.

A method, comprising:

• receiving a request to determine whether to perform a media management operation on a plurality of groups of memory cells;
• performing a scan operation on a sample group of the plurality of groups of memory cells to determine a reliability of the sample group that is representative of a reliability of the plurality of groups of memory cells;
• and
• performing the media management operation on the plurality of groups of memory cells based on a comparison between the determined reliability of the sample group and a threshold reliability.