System and method for capping outliers during an experiment test
AssigneeCoupang Corp.
InventorsQian WENG, Jun YE, Beibei YE
Life of this patent
Estimating the term…
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AssigneeCoupang Corp.
InventorsQian WENG, Jun YE, Beibei YE
Estimating the term…
A computer-implemented systems and methods for capping outliers during an experiment test is disclosed. The computer implemented system comprises a memory storing instructions and at least one or more processors. The at least one or more processors may be configured to configured to execute the instructions to determine at least two groups of users comprising a plurality of users; obtain metric data related to each of the plurality of users; calculate a first value and a second value based on the metric data; identify an occurrence of a trigger event, using the metric data, the first value, and the second value; distribute the metric data into capped data and uncapped data and determine a threshold for the capped data; calculate a third value for the capped data and the uncapped data; determine if the capped data threshold has changed based on the third value; and implement at least one capping percentile value upon occurrence of the trigger event.
A computer-implemented system for capping outliers during a test, the system comprising:
A computer-implemented method for capping outliers during a test, the method comprising:
Dependencies are inferred from the claim text.