Electronic device and corresponding self-test method

A method of operating an electronic device having analog circuitry and self-test controller circuitry for cooperating with the analog circuitry to perform testing of the electronic device, the method comprising:

• activating the self-test controller circuitry;
• in response to activation of the self-test controller circuitry, setting the analog circuitry to a plurality of different self-test configurations and then sensing test signals occurring in the analog circuitry;
• acquiring and digitizing the sensed test signals;
• checking the digitized sensed test signals against reference parameters;
• and
• generating at least one fault detection signal in response to the checking indicating that the digitized sensed test signals fail to match the reference parameter.

An electronic device, comprising:

• analog circuitry configured to be settable to at least one self-test configuration;
• and
• self-test controller circuitry, comprising:
• an analog configuration and sensing circuit configured to set said analog circuitry to said at least one self-test configuration and to sense test signals occurring in said analog circuitry set to said at least one self-test configuration;
• a data acquisition circuit configured to acquire and digitize said sensed test signals;
• a fault event detection circuit configured to check said digitized sensed test signals against reference parameters;
• and
• a datapath configuration circuit coupled between said data acquisition circuit and said fault event detection circuit, the datapath configuration circuit configured to provide a plurality of digital processing datapath configurations for said digitized sensed test signals.

A method of operating an electronic device having analog circuitry and self-test controller circuitry for cooperating with the analog circuitry to perform testing of the electronic device, the method comprising:

• activating the self-test controller circuitry;
• in response to activation of the self-test controller circuitry, setting the analog circuitry to at least one self-test configuration and then sensing test signals occurring in the analog circuitry;
• acquiring and digitizing the sensed test signals;
• checking the digitized sensed test signals against reference parameters;
• generating at least one fault detection signal in response to the checking indicating that the digitized sensed test signals fail to match the reference parameter.