Methods for forming contact structures and semiconductor devices thereof
AssigneeYangtze Memory Technologies Co., Ltd.
InventorsLinchun Wu, Kun Zhang, Zhong Zhang, Wenxi Zhou, Zhiliang Xia
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AssigneeYangtze Memory Technologies Co., Ltd.
InventorsLinchun Wu, Kun Zhang, Zhong Zhang, Wenxi Zhou, Zhiliang Xia
Estimating the term…
Embodiments of methods for forming contact structures and semiconductor devices thereof are disclosed. In an example, a semiconductor device includes an insulating layer, a conductive layer over the insulating layer, and a spacer structure in the conductive layer and in contact with the insulating layer. The semiconductor device also includes a first contact structure in the spacer structure and extending vertically through the insulating layer. The first contact structure includes a first contact portion and a second contact portion in contact with each other. An upper surface of the second contact portion is coplanar with an upper surface of the conductive layer.
A semiconductor device, comprising:
A semiconductor device, comprising:
A method for forming a semiconductor device, comprising:
Dependencies are inferred from the claim text.