Methods and apparatus for forming stabilization layers
AssigneeApplied Materials, Inc.
InventorsWenjing XU, Gang SHEN, Feng CHEN, Tae Hong HA
Life of this patent
Estimating the term…
Loading patent…
AssigneeApplied Materials, Inc.
InventorsWenjing XU, Gang SHEN, Feng CHEN, Tae Hong HA
Estimating the term…
Methods and apparatus that forms a stabilization layer on copper-based material to inhibit formation of copper voids in the copper-based material. In some embodiments, a method of forming the stabilization layer on the copper-based material includes depositing a first stabilization layer on the copper-based material where the first stabilization layer forms a continuous film on the copper-based material and is formed of a first material that does not alloy with copper, depositing a second stabilization layer on the first stabilization layer where the second stabilization layer is formed from a second material that alloys with copper and where the first stabilization layer is configured to inhibit formation of voids in the copper-based material during subsequent high thermal budget processing.
A method of forming a stabilization layer on copper-based material, comprising:
A method of forming a capping layer on copper-based material, comprising:
A non-transitory, computer readable medium having instructions stored thereon that, when executed, cause a method for forming a stabilization layer on copper-based material to be performed, the method comprising:
Dependencies are inferred from the claim text.