System and method for controlling semiconductor manufacturing equipment
AssigneeNanya Technology Corporation
InventorSun-Fu CHOU
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AssigneeNanya Technology Corporation
InventorSun-Fu CHOU
Estimating the term…
The present disclosure provides systems and methods for controlling a semiconductor manufacturing equipment. A control system includes a sensor unit capturing a set of data related to a gas pressure in the equipment, a sensor interface receiving the set of data and generating at least one input signal for a database server, and a control unit. The control unit includes a front end subsystem, a calculation subsystem, and a message and feedback subsystem. The front end subsystem performs a front end process to generate a data signal. The calculation subsystem performs an artificial intelligence analytical process to determine, according to the data signal, whether a malfunction related to the gas pressure has occurred and generate an output signal. The message and feedback subsystem generates an alert signal and a feedback signal according to the output signal and transmits the alert signal to a user.
A control system of a semiconductor manufacturing equipment, comprising:
A control system of a semiconductor manufacturing equipment comprising:
The control system of claim 11, the one or more computer-readable non-transitory storage media further comprising instructions operable when executed by the one or more processors to cause the control system to perform the AI analytical process by utilizing a statistical prediction model corresponding to the data signal to predict a failure and contamination time of the semiconductor manufacturing equipment.
A method for controlling a semiconductor manufacturing equipment comprising:
Dependencies are inferred from the claim text.