Method for forming semiconductor structure
AssigneeChangxin Memory Technologies, Inc.
InventorDAEJOONG WON
Life of this patent
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Abstract
A method for forming a semiconductor structure includes: providing a substrate, a gate dielectric layer and an undoped polycrystalline silicon layer sequentially stacked; performing a thermal doping process, and doping first doping ions in the polycrystalline silicon layer; and performing an ion implantation process, and doping second doping ions in a preset region of the polycrystalline silicon layer. The preset region is spaced at a preset distance from a surface of the polycrystalline silicon layer away from the gate dielectric layer in a direction perpendicular to a surface of the substrate.
Claims15
A method for forming a semiconductor structure, comprising:
- providing a substrate, a gate dielectric layer and an undoped polycrystalline silicon layer sequentially stacked;
- performing a thermal doping process, and doping first doping ions in the polycrystalline silicon layer;
- and
- performing an ion implantation process, and doping second doping ions in a preset region of the polycrystalline silicon layer, wherein the preset region is spaced at a preset distance from a surface of the polycrystalline silicon layer away from the gate dielectric layer in a direction perpendicular to a surface of the substrate.
Dependencies are inferred from the claim text.