Methods and apparatus to monitor lab equipment
AssigneeIllinois Tool Works Inc.
InventorsSarah M. Beranek, Benjamin Mangrich, Julien Noel
Life of this patent
Estimating the term…
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AssigneeIllinois Tool Works Inc.
InventorsSarah M. Beranek, Benjamin Mangrich, Julien Noel
Estimating the term…
An example system to monitor lab equipment includes: lab devices configured to perform sectioning, grinding, mounting, polishing, imaging, and/or hardness testing, of specimens; and an equipment monitoring system configured to: receive the data from the lab devices, the data comprising identifiers of the lab devices, operating statuses of the lab devices, current operating cycle information for the lab devices, error codes, and parameters of the operating cycles performed by the lab devices, wherein the lab devices are configured to transmit the data to the equipment monitoring system via a network; based on the error codes, output operator-readable information associated with the lab devices from which the error codes were received; and in response to at least one of the operating statuses, the current operating cycle information, the error codes, or the parameters satisfying an event definition, output an operator-readable notification identifying an operator action item based on the event definition.
A system to monitor lab equipment, the system comprising:
A method to monitor lab equipment, the method comprising:
Dependencies are inferred from the claim text.