Memory device and method of operating the same

A method of operating a memory device including a system block for storing test information and a data block including memory cells connected to a plurality of low bank column lines and a plurality of high bank column lines, the method comprising:

• storing packaging test information, which is included in test data stored in the system block, in a first register;
• storing wafer test information, which is included in the test data stored in the system block, in a second register;
• and
• detecting, based on the wafer test information and the packaging test information, a concurrent repair column line in which a low bank column line among the plurality of low bank column lines and a high bank column line the plurality of high bank column lines corresponding to the same column address are concurrent repaired.

A method of operating a memory controller for controlling a memory device, the method comprising:

• providing a reset command to the memory device;
• providing a status read command for requesting status information stored in the memory device;
• receiving the status information from the memory device;
• and
• storing information on whether the memory device is defective based on concurrent repair information included in the status information.