Semiconductor device including defect detection circuit and method of detecting defects in the same

A method of detecting defects in a semiconductor device, the method comprising:

• forming an open conduction loop in a peripheral region of a semiconductor die, the peripheral region surrounding a central region of the semiconductor die, the forming the open conduction loop by using a defect detection circuit arranged in the peripheral region, the defect detection circuit including a plurality of latch circuits and a plurality of defect detection conduction paths, each defect detection conduction path of the plurality of defect detection conduction paths connecting two adjacent latch circuits of the plurality of latch circuits;
• performing a test write operation by sequentially transferring bits of an input data pattern in a forward direction of the open conduction loop and storing the bits of the input data pattern in the plurality of latch circuits;
• performing a test read operation by transferring bits stored in the plurality of latch circuits in a backward direction of the open conduction loop and reading out an output data pattern;
• and
• determining a defect detection conduction path including the presence of or absence of a defect among the plurality of defect detection conduction paths by comparing the input data pattern and the output data pattern.

A defect detection circuit comprising:

• a plurality of latch circuits;
• and
• a plurality of defect detection conduction paths, each defect detection conduction path of the plurality of defect detection conduction paths connecting two adjacent latch circuits of the plurality of latch circuits,
• wherein the defect detection circuit is in a peripheral region of a semiconductor die surrounding a central region of the semiconductor and is arranged in an open conduction loop, and
• each latch circuit of the plurality of latch circuits is configured to transfer a bit stored in each latch circuit per shifting period to an adjacent latch circuit, the transferring in a forward direction of the of the open conduction loop or a backward direction of the open conduction loop.