Machine learning device
AssigneeSeiko Epson Corporation
InventorAkihiko TSUNOYA
Life of this patent
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Abstract
A machine learning device includes: a data acquisition unit configured to acquire first data including shape data related to a target shape of a three-dimensional shaped object and shaping condition data related to a condition when the three-dimensional shaped object is shaped by the three-dimensional shaping device, and second data related to a deformation of the three-dimensional shaped object; a storage unit that stores learning data set including a plurality of the first data and a plurality of the second data; and a learning unit configured to learn a relationship between the first data and the second data by executing machine learning using the learning data set.
Claims8
A machine learning device, comprising:
- a data acquisition unit configured to acquire first data including shape data related to a target shape of a three-dimensional shaped object and shaping condition data related to a shaping condition when the three-dimensional shaped object is shaped by a three-dimensional shaping device, and second data related to a deformation of the three-dimensional shaped object;
- a storage unit that stores learning data set including a plurality of the first data and a plurality of the second data;
- and
- a learning unit configured to learn a relationship between the first data and the second data by executing machine learning using the learning data set.
Dependencies are inferred from the claim text.