Learning apparatus, estimation apparatus, parameter calculation method and program
AssigneeNippon Telegraph and Telephone Corporation
InventorsTomoharu IWATA, Yuki YAMANAKA
Life of this patent
Estimating the term…
Loading patent…
AssigneeNippon Telegraph and Telephone Corporation
InventorsTomoharu IWATA, Yuki YAMANAKA
Estimating the term…
A learning apparatus includes an input data reading unit configured to input data and a label indicating whether the data is abnormal, an objective function calculation unit configured to calculate a value of an objective function based on the label and a predetermined function for calculating an anomaly score of the data by applying a parameter relating to the anomaly score, by using the data and a value of the parameter, and a parameter update unit configured to calculate a value of the parameter that maximizes the value of the objective function by repeatedly executing a process by the objective function calculation unit while updating the value of the parameter.
A learning apparatus comprising:
A parameter calculation method at a learning apparatus, the method comprising:
A computer-readable non-transitory recording medium storing computer-executable program instructions that when executed by a processor cause a computer system to:
Dependencies are inferred from the claim text.