Modeling natural space environment effects on hardware

A non-transitory machine-readable medium including instructions that, when executed by a machine, cause the machine to perform operations for determining a probability that operation of an electronic part of a device will be upset by a single event effect (SEE), the operations comprising:

• partitioning a trajectory of the device into disjoint time segments;
• determining, based on an effective shielding of the device and one or more flux lookup tables (LUTs) for each of the time segments, respective SEE rates experienced by the electronic part for each time segment;
• determining, based on the determined respective SEE rates and using a model for determining a value representing a probability that operation of the electronic part of the device will be upset by the SEE, the probability;
• and
• providing an indication to allow the device to traverse the trajectory only if the determined probability is less than a specified threshold.

A system comprising:

• memory storing data indicating operations for implementing a model for determining a probability that operation of an electronic part of a device will be upset by a single event effect (SEE), one or more flux lookup tables (LUTs), a trajectory of the device, and effective shielding of the device;
• and
• processing circuitry coupled to the memory, the processing circuitry configured to:
• partition the trajectory into disjoint time segments;
• determine, based on the effective shielding and the one or more flux LUTs for each of the time segments, respective SEE rates experienced by the electronic part for each time segment;
• determine, based on the determined respective SEE rates and using the operations of the model, a probability that operation of the electronic part of the device will be upset by the SEE, the probability;
• and
• provide an indication to allow the device to traverse the trajectory only if the determined probability is less than a specified threshold.