Determining diagnostic coverage for achieving functional safety

A system comprising:

• one or more computer processors;
• and
• one or more computer-readable mediums storing instructions that, when executed by the one or more computer processors, cause the system to perform operations comprising:
• accessing a netlist and optimization parameters, the netlist describing connectivity of a plurality of nodes included in an electronic circuit, and the optimization parameters defining parameters for reducing a number of nodes included in the netlist;
• applying, based on the optimization parameters, at least a first node reduction technique to the netlist, resulting in an optimized netlist for the electronic circuit, the optimized netlist describing connectivity of a subset of the plurality of nodes included in the electronic circuit;
• identifying, based in the optimized netlist, a set of safety mechanisms for achieving a target diagnostic coverage level associated with the electronic circuit;
• and
• determining a diagnostic coverage level of the electronic circuit based on the optimized netlist and the set of safety mechanisms.

A non-transitory computer-readable medium storing instructions that, when executed by one or more computer processors of one or more computing devices, cause the one or more computing devices to perform operations comprising:

• accessing a netlist and optimization parameters, the netlist describing connectivity of a plurality of nodes included in an electronic circuit, and the optimization parameters defining parameters for reducing a number of nodes included in the netlist;
• applying, based on the optimization parameters, at least a first node reduction technique to the netlist, resulting in an optimized netlist for the electronic circuit, the optimized netlist describing connectivity of a subset of the plurality of nodes included in the electronic circuit;
• identifying, based in the optimized netlist, a set of safety mechanisms for achieving a target diagnostic coverage level associated with the electronic circuit;
• and
• determining a diagnostic coverage level of the electronic circuit based on the optimized netlist and the set of safety mechanisms.