US 2022/0034937 A1Published application

Contact pin and socket

AssigneeEnplas Corporation

InventorYuki Ueyama

Life of this patent

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Abstract

Provided is a contact pin comprising: a hollow first plunger that includes a first contact portion provided on one end side in a first direction and a first enlarged portion which is enlarged in a second direction intersecting the first direction; a second plunger, the one end of which is inserted into the first plunger and that includes a second contact portion provided on the other end side in the first direction and a second enlarged portion provided in a protruding portion protruding from the first plunger so as to be enlarged in the second direction; and a spring provided between the first and second plungers so as to surround the first and second plungers, wherein the first enlarged portion forms a curve shape to bulge outward.

Claims3

Dependent claims

A contact pin, comprising:

a first plunger of a hollow type, including a first contact portion provided on a first end side in a first direction, and a first enlarged portion which expands in a second direction intersecting the first direction;
a second plunger including a second contact portion of which a first end in the first direction is inserted in the first plunger and which is provided on a second end side opposite to the first end side in the first direction, and a second enlarged portion which is provided in a protruding portion protruding from the first plunger and expands in the second direction;
and
a spring surrounding the first plunger and the second plunger and attached between the first enlarged portion and the second enlarged portion, wherein
the first enlarged portion is formed in a curved surface shape bulging outward.

2 more elements

Dependencies are inferred from the claim text.

Facts

Application: 17/280,208Filed 20 Sep 2019
Priority: JP 2018-18071126 Sep 2018
Published: 3 Feb 2022
Term ends: Not estimatedThe source records don’t support an estimate.

Classification3 codes

G01R 1/07314
With individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or…:…
G01R 31/2886
Testing of integrated circuits [IC]: features relating to contacting the IC under test, e.g. probe heads; chucks
G01R
Measuring electric variables

Family

US 11,506,684 B2Related patent
US 2022/0034937 A1This patent

From the US filing history. Foreign family members aren’t listed.

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