Testing device
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsHideaki SHISHIDO, Takayuki IKEDA
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AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsHideaki SHISHIDO, Takayuki IKEDA
Estimating the term…
A cost of a testing device is reduced. A structure of a testing device is simplified. A testing device capable of testing with higher accuracy is provided. A testing device (10) has a structure including a sending unit (13), a receiving unit (14), a control unit (11), and a display (15). The control unit includes a memory portion (21) and an arithmetic portion (22). The sending unit has a function of generating a pulse signal for a probe (40) to generate an ultrasonic wave (51). The receiving unit has a function of generating a first signal including a first analog data (D1) on the basis of the input single input from the probe. The memory portion has a function of storing the first analog data. The arithmetic portion has a function of generating an image signal (S0) output to the display on the basis of the first analog data stored in the memory portion. The display has a function of displaying an image based on the image signal.
A testing device comprising a sending unit, a receiving unit, a control unit, and a display,
Dependencies are inferred from the claim text.