Method of diagnosing the lifetime of structures and system for diagnosing the same
AssigneeMACTEC Corp.
InventorsYoung Suk Kim, Sung Soo Kim
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Abstract
The present invention relates to a method of diagnosing the lifetime of a structure and a system for diagnosing the same, the method comprises a step for preparing a structure to be measured; a step for measuring an amount of exothermic or endothermic heat of the structure; a step for measuring an amount of entropy decrease of the structure by using the measured amount of exothermic or endothermic heat; and a step for diagnosing the remaining lifetime of the structure from the measured amount of entropy decrease.
Claims17
A method of diagnosing the lifetime of a structure comprising;
- a step for preparing a structure to be measured;
- a step for measuring an amount of exothermic or endothermic heat of the structure;
- a step for determining an amount of entropy decrease of the structure from the measured amount of exothermic or endothermic heat;
- and
- a step for diagnosing the remaining lifetime of the structure from the measured amount of entropy decrease.
A method of diagnosing the lifetime of a structure comprising;
- a step for preparing a structure to be measured;
- a step for measuring the magnitude of compressive stress of the structure;
- a step for measuring an amount of entropy decrease of the structure by using the measured magnitude of compressive stress;
- and
- a step for diagnosing the remaining lifetime of the structure from the measured amount of entropy decrease.
A method of diagnosing the lifetime of a structure comprising;
- a step for preparing a structure to be measured;
- a step for measuring an amount of lattice contraction of the structure;
- a step for measuring an amount of entropy decrease of the structure by using the measured amount of lattice contraction;
- and
- a step for diagnosing the remaining lifetime of the structure from the measured amount of entropy decrease.
A method of diagnosing the lifetime of a structure comprising;
- a step for preparing a structure to be measured;
- a step for measuring the physical properties of the structure;
- a step for measuring an amount of entropy decrease of the structure from the measured changes in physical properties;
- and
- a step for diagnosing the remaining lifetime of the structure from the measured amount of entropy decrease,
- wherein the physical properties include hardness, thermoelectric power, electrical resistance, Barkuhausen noise amplitude, shear modulus, elastic modulus or Young's modulus, or a combination thereof of the structure.
A system for diagnosing the lifetime of a structure comprising:
- a measuring device which measures an amount of exothermic or endothermic heat of the structure, a magnitude of compressive stress of the structure, an amount of lattice contraction of the structure, or the physical properties of the structure;
- and
- an electronic device for measuring an amount of entropy decrease of the structure by using the measured amount of exothermic or endothermic heat, the measured magnitude of compressive stress, the measured amount of lattice contraction, or the measured changes in physical properties provided from the measuring device, and diagnosing the remaining lifetime of the structure from the measured amount of entropy decrease,
- wherein the physical properties include hardness, thermoelectric power, electrical resistance, Barkuhausen noise amplitude, shear modulus, elastic modulus or Young's modulus, or a combination thereof of the structure.
Dependencies are inferred from the claim text.