Measurement system and measurement method

A measurement system for measuring an emission light output from an optical semiconductor element, the system comprising:

• an optical probe configured to receive the emission light on an incident end surface;
• an optical probe head configured to hold the optical probe;
• and
• a driving device configured to move at least either the optical probe head or the optical semiconductor element,
• the driving device shifting a relative position between the optical semiconductor element and the optical probe on a plane surface intersecting with an optical axis of the emission light,
• the measurement system being configured to measure an incident intensity of the emission light at several positions and obtain an incident intensity pattern showing a relationship between a change in the relative position and the respective incident intensities.