Method and device for real-time measuring sunlight on buildings
AssigneeShenzhen XKool Technology CO., Ltd.
InventorsWanyu He, Qiyun Wei
Life of this patent
Estimating the term…
Loading patent…
AssigneeShenzhen XKool Technology CO., Ltd.
InventorsWanyu He, Qiyun Wei
Estimating the term…
A method and device for real-time measuring sunlight on buildings,comprises: receiving training satellite images of training buildings, analyzing training satellite image features, extracting training building outline information, training building height information and training information of profile sunlight map sequence of corresponding continuous height; according to the preset training latitude and longitude range, obtaining the corresponding training building outline information, training building height information and training information of profile sunlight map sequence of corresponding continuous height; and training to obtain a sunlight testing model; receiving target location information of the cadastral land parcel to be measured, obtaining corresponding target latitude and longitude according to the target location information; receiving target building outline information and target building height difference information of the cadastral land parcel to be measured, and obtaining a sequence of sunlight maps of the buildings within cadastral land parcel according to the sunlight testing model.
A method for real-time measuring sunlight on buildings, comprising:
A device for real-time measuring sunlight on buildings, characterized in that, comprises:
Dependencies are inferred from the claim text.