Enhanced sensor alignment

A method comprising:

• determining, by a processor, a first array of displacement sensors proximate to a first test structure;
• determining a second array of displacement sensors proximate to a second test structure;
• applying a test condition to the first array, the second array, the first test structure, and the second test structure;
• collecting a first output from applying the test condition to the first test structure;
• collecting a second output from applying the test condition to the second test structure;
• generating a first deviation vector associated with the first output;
• generating a second deviation vector associated with the second output;
• determining a first design status of the first structure based on the first deviation vector;
• and
• determining a second design status of the second structure based on the second deviation vector.

A system, comprising:

• at least one memory that stores computer-executable instructions;
• and
• at least one processor configured to access the at least one memory and execute the computer-executable instructions to:
• determine a first array of displacement sensors proximate to a first test structure;
• determine a second array of displacement sensors proximate to a second test structure;
• apply a test condition to the first array, the second array, the first test structure, and the second test structure;
• collect a first output from applying the test condition to the first test structure;
• collect a second output from applying the test condition to the second test structure;
• generate a first deviation vector associated with the first output;
• generate a second deviation vector associated with the second output;
• determine a first design status of the first structure based on the first deviation vector;
• and
• determine a second design status of the second structure based on the second deviation vector.