Image analysis system and operating method of the same
AssigneeInstitute for Basic Science
InventorsMeeyoung CHA, Sungwon HAN, Sungwon PARK, Sundong KIM, Sungkyu PARK
Life of this patent
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AssigneeInstitute for Basic Science
InventorsMeeyoung CHA, Sungwon HAN, Sungwon PARK, Sundong KIM, Sungkyu PARK
Estimating the term…
Disclosed is an image analysis system which includes a first analyzer and a second analyzer. The first analyzer generates first features by encoding images through a first model and adjusts a weight of the first model based on the first features. The second analyzer generates second features based on the first features by encoding the images through a second model, classifies the second features into classes, respectively, and adjusts a weight of the second model based on mutual information and a correlation between a first class among the classes which features corresponding to an original image group from among the second features are classified as and a second class among the classes which features corresponding to an augmentation group of the original image group from among the second features are classified as.
An image analysis system comprising:
An operating method of an image analysis system, the method comprising:
Dependencies are inferred from the claim text.