Abnormal condition detection based on temperature monitoring of memory dies of a memory sub-system
AssigneeMicron Technology, Inc.
InventorsZhenming Zhou, Jiangli Zhu
Life of this patent
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AssigneeMicron Technology, Inc.
InventorsZhenming Zhou, Jiangli Zhu
Estimating the term…
A set of temperature measurements corresponding to a set of memory dies of a memory sub-system is collected. The set of temperature measurements includes a temperature measurement determined for each memory die of the set of memory dies. A determination is made whether a first temperature measurement of the set of temperature measurements satisfies a first condition. It is determined whether a temperature variation of the set of temperature measurements satisfies a second condition. In response to a determination that the first temperature measurement satisfies the first condition or the temperature variation satisfies the second condition, a temperature related event is logged. A message is sent to a host system indicating the temperature related event.
A method comprising:
A non-transitory computer readable medium comprising instructions, which when executed by a processing device, cause the processing device to perform operations comprising:
A system comprising:
Dependencies are inferred from the claim text.