Scanning probe microscope and scanning probe microscope optical axis adjustment method
AssigneeShimadzu Corporation
InventorMasato HIRADE
Life of this patent
Estimating the term…
Abstract
A scanning probe microscope is provided with a cantilever having a probe at a tip end thereof, an optical system for emitting laser light onto the cantilever and detecting the laser light reflected by the cantilever, an imaging unit for imaging a range including a position of the tip end of the cantilever when adjusting an optical axis of the laser light, an image processing unit for detecting a position of the tip end of the probe and a position of a spot of the laser light from an image generated by the imaging unit, an optical axis adjustment unit for adjusting the optical axis of the laser light based on the detected positions, and a sample holder for holding a sample. The sample holder includes a mirror.
Claims2
1-6. (canceled)
An optical axis adjustment method of a scanning probe microscope,
- wherein the scanning probe microscope comprises:
- a cantilever provided with a probe at a tip end portion thereof;
- an optical system configured to emit laser light onto the cantilever and detect the laser light reflected by the cantilever when performing measurement;
- and
- a sample holder configured to hold a sample, the sample holder including a mirror and a sample stage capable of being placed above the mirror, and
- wherein the optical axis adjustment method comprising the steps of:
- making a state in which the sample stage is not placed above the mirror;
- emitting the laser light by the optical system;
- imaging a region including a position of a tip end of the cantilever;
- detecting a position of a tip end of the probe and a position of a spot of the laser light from an image generated by the imaging;
- and
- adjusting an optical axis of the laser light based on the detected positions.
Dependencies are inferred from the claim text.