Reliability health prediction by high-stress seasoning of memory devices

A system comprising:

• a test set up comprising a plurality of memory dies;
• and
• a processing device, operatively coupled to the plurality of memory dies, to perform screening operations for each of the plurality of memory dies, the screening operations comprising:
• predetermining a plurality of checkpoints during an accelerated seasoning test, wherein each checkpoint of the plurality of checkpoints corresponds to a cycle threshold criterion;
• determining whether a number of accelerated seasoning cycles performed on a memory die satisfies a cycle threshold criterion for a first checkpoint;
• responsive to determining that the number of accelerated seasoning cycles satisfies the cycle threshold criterion for the first checkpoint, determining an error rate associated with the memory die;
• determining whether the error rate satisfies an error threshold criterion specific to a predetermined reliability rating;
• and
• responsive to determining that the error rate satisfies the error threshold criterion, repeating the screening operations until a cycle threshold criterion for a next checkpoint is satisfied.

A non-transitory computer readable medium comprising instructions, which when executed by a processing device, cause the processing device to perform operations comprising:

• associating an accelerated seasoning cycle criterion with a memory die of a plurality of memory dies;
• subjecting the memory die to one or more accelerated seasoning conditions during accelerated seasoning cycles;
• responsive to determining, by a processing device, that the accelerated seasoning cycle criterion has been satisfied, performing a defect scan on the memory die;
• and
• associating, by the processing device, the memory die with a respective reliability bin of a plurality of reliability bins in view of a result of the defect scan, wherein the result of the defect scan satisfies one or more predetermined threshold reliability criteria corresponding to the respective reliability bin.