Input/output capacitance measurement, and related methods, devices, and systems
AssigneeMicron Technology, Inc.
InventorHyunui Lee
Life of this patent
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AssigneeMicron Technology, Inc.
InventorHyunui Lee
Estimating the term…
A device may include a current source configured to couple a charged node to a ground voltage to generate a current. The device may include a second circuit coupled to the node and configured to compare, beginning during a first clock cycle of a clock signal and for each clock cycle of a number of clock cycles of the clock signal, the voltage at the node to a reference voltage to generate a result. The device may further include a control unit configured to: detect, upon completion of a subsequent clock cycle of the clock signal, a change in the result; determine, in response to the change in the result, a transition time based on a number of elapsed clock cycles from the first clock cycle to completion of the subsequent clock cycle; and determine a capacitance of the node based on the transition time. Related systems and methods are also described.
A device, comprising:
A method, comprising:
A system comprising:
Dependencies are inferred from the claim text.