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US 2022/0003670 A1Published application
Apparatuses, systems, and methods for sample testing
AssigneeHand Held Products, Inc.
InventorsAdam Dewey MCBRADY, Chen FENG, Moin SHAFAI, Suresh VENKATARAYALU
Life of this patent
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Abstract
Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substrate layer and includes at least one reference channel and at least one sample channel.
Claims20
A sample testing device comprising:
- a pump;
- a first valve connecting the pump to a first flow channel of a waveguide;
- and
- a buffer loop connecting the first flow channel of the waveguide to a second valve.
1 more element
Dependencies are inferred from the claim text.