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US 2021/0344337 A1Published application
Method for protecting a transistor from overload and electronic circuit
AssigneeInfineon Technologies AG
InventorMarkus Bader
Life of this patent
Estimating the term…
Abstract
A method is described. The method comprises determining a first measurement signal (CS1) which depends on a first load current (I1) through a first transistor (Q1) which is connected in series to a load (Z); determining a second measurement signal (CS2) which depends on a second load current (I2) through a second transistor (Q2) which is connected in series to the load (Z); and comparing the first measurement signal (CS1) and the second measurement signal (CS2), in order to detect the presence of an error.
Claims21
A method comprising
- determining a first measurement signal which depends on a first load current through a first transistor which is connected in series to a load;
- determining a second measurement signal which depends on a second load current through a second transistor which is connected in series to the load;
- and
- comparing the first measurement signal and the second measurement signal, in order to detect the presence of an error.
1 more element
An electronic circuit comprising:
- a first electronic switch configured to be connected in series to a load;
- a second electronic switch configured to be connected in series to the load;
- an error detection circuit configured
- to determine a first measurement signal which depends on a first load current through the first transistor,
- to determine a second measurement signal which depends on a second load current through the second transistor, and
- to compare the first measurement signal and the second measurement signal, in order to detect the presence of an error.
3 more elements
Dependencies are inferred from the claim text.