Joint structure, semiconductor device, and method of manufacturing same
AssigneeMitsubishi Electric Corporation
InventorsKoji YAMAZAKI, Yoshio TAMURA
Life of this patent
Estimating the term…
Loading patent…
AssigneeMitsubishi Electric Corporation
InventorsKoji YAMAZAKI, Yoshio TAMURA
Estimating the term…
Provided is a joint structure interposed between a semiconductor element and a substrate, the joint structure including: a Sn phase; Cu alloy particles containing P in an amount of 1 mass % or more and less than 7 mass %; and Ag particles, wherein the Cu alloy particles are each coated with a Cu6Sn5 layer, wherein the Ag particles are each coated with a Ag3Sn layer, wherein the Cu alloy particles and the Ag particles are at least partially bonded to each other through a Cu10Sn3 phase, wherein a total of addition amounts of the Cu alloy particles and the Ag particles is 25 mass % or more and less than 65 mass % with respect to the joint structure, and wherein a mass ratio of the addition amount of the Ag particles to the addition amount of the Cu alloy particles is 0.2 or more and less than 1.2.
A joint structure interposed between a semiconductor element and a substrate,
A semiconductor device, comprising:
A method of manufacturing a semiconductor device, comprising the steps of:
Dependencies are inferred from the claim text.