Page buffer and memory device including the same
AssigneeSamsung Electronics Co., Ltd.
InventorsSe Won Yun, Kyung Min Kang, Dong Ku Kang
Life of this patent
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Abstract
Systems and methods are described including a page buffer to reduce a threshold voltage distribution skew of memory cells and improve programming performance. The page buffer includes a first circuit element connected to a first terminal for supplying a first bitline voltage, a second circuit element connected to a second terminal for supplying a second bitline voltage, and a latch configured to control the first and second circuit elements.
Claims20
A memory device comprising:
- a stacked structure disposed on a substrate, wherein the stacked structure comprises a plurality of gate electrode layers alternating with a plurality of insulating layers;
- one or more channel structures penetrating through the stacked structure, wherein the channel structures are disposed on an epitaxial layer connected to the substrate;
- and
- a wordline cut region dividing the stacked structure into a plurality of regions,
- wherein the gate electrode layers comprise a ground select line, a string select line, and a plurality of wordlines disposed between the ground select line and the string select line,
- the wordlines and the channel structures adjacent to the wordlines provide memory cells, and
- a thickness of each of the wordlines decreases and a bitline voltage input to a bitline connected to the memory cells decreases as a distance from the wordline cut region increases.
A programming method of at least one memory cell among a plurality of memory cells of a memory device, the programming method comprising:
- determining an operating mode of the memory device;
- determining whether a selected memory cell exists among the plurality of memory cells;
- supplying a bitline voltage higher than a ground voltage and lower than a power supply voltage to a bitline connected to the plurality of memory cells when a selected memory cell is one of the memory cells and the operating mode is a first mode;
- and
- supplying a predetermined bitline voltage to a bitline connected to the plurality of memory cells when a selected memory cell is one of the memory cells and the operating mode is a second mode.
A memory device comprising:
- a stacked structure disposed on a substrate, wherein the stacked structure comprises a plurality of gate electrode layers alternating with a plurality of insulating layers;
- one or more channel structures penetrating through the stacked structure, wherein the channel structures are disposed on an epitaxial layer connected to the substrate;
- and
- a wordline cut region penetrating through the stacked structure, wherein the wordline cut region is disposed between the channel structures, and dividing the gate electrode layers and insulating layers into a plurality of regions,
- wherein each of the channel structures comprises a channel layer and a gate insulating layer,
- the gate electrode layers comprise a ground select line, a string select line, and a plurality of wordlines disposed between the ground select line and the string select line,
- the wordlines and channel structures adjacent to the wordlines provide memory cells, and
- a thickness of the gate insulating layers increases and a bitline voltage input to a bitline connected to the memory cells decreases as a distance from the wordline cut region increases.
Dependencies are inferred from the claim text.