Methods and apparatus to perform load measurements on hinged devices

Abstract

An example hinged device flexible substrate testing system includes: a first plate comprising a first surface configured to hold stationary a first side of a hinged device under test; a second plate comprising a second surface configured to hold a second side of the hinged device under test; a first cam follower coupled to the second plate; a first drive arm configured to move the first cam follower to cause the second plate to rotate about a hinge pivot axis of the hinged device under test; an actuator configured to rotate the drive arm; and a load cell configured to measure loads on the first plate while the actuator moves the second plate.

Dependencies are inferred from the claim text.