System and process for roof measurement using imagery
AssigneePictometry International Corp.
InventorsDale R. Thornberry, Chris T. Thornberry, Mark F. Garringer
Life of this patent
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AssigneePictometry International Corp.
InventorsDale R. Thornberry, Chris T. Thornberry, Mark F. Garringer
Estimating the term…
The present disclosure describes systems and processes, including a computer process, comprising: determining, with one or more computer processors, attributes of a roof of a real-world three-dimensional building by: creating, with the one or more computer processors, a first electronic line drawing of a first plane of a roof of a building in a first drawing layer overlaid on an image depicting the roof of the building; creating, with the one or more computer processors, a second electronic line drawing of a second plane of the roof of the building in a second drawing layer on the image depicting the roof of the building, the first electronic line drawing and the second electronic line drawing having one or more overlapping lines; and assigning, with the one or more computer processors, one or more non-dimensional attributes to the overlapping lines, the non-dimensional attributes identifying one or more types of roof structures.
A computer system, comprising:
A computer process, comprising:
Dependencies are inferred from the claim text.