Concurrent image measurement and execution
AssigneeMicron Technology, Inc.
InventorOlivier Duval
Life of this patent
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AssigneeMicron Technology, Inc.
InventorOlivier Duval
Estimating the term…
Apparatuses and methods related to concurrently measuring and executing images. An apparatus for concurrently measuring and executing images can include a memory device, a first processing resource and a second processing resource. The first processing resource can execute instructions stored in the memory device to execute a first portion of an image responsive to measuring the first portion of the image and execute a second portion of the image responsive to measuring the second portion of the image. The second processing resource can execute instructions stored in the memory device to measure the first portion of the image and measure the second portion of the image concurrently with an execution of the first portion of the image by the first processing resource.
A method comprising:
An apparatus, comprising:
An apparatus, comprising:
Dependencies are inferred from the claim text.