Memory device having a secure test mode entry
AssigneeMicron Technology, Inc.
InventorsAlberto Troia, Antonino Mondello
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AssigneeMicron Technology, Inc.
InventorsAlberto Troia, Antonino Mondello
Estimating the term…
The present disclosure relates to a memory device comprising: an array of memory cells; and an access management architecture providing a secure access to a test mode of the array of memory cells, the access management architecture comprising: a register group comprising data identifying the memory device; a cryptographic algorithm calculating an internal signature having a mechanism for ensuring data freshness; a non volatile memory area storing specific data to be used by the cryptographic algorithm for calculating the internal signature; a comparison block for comparing the calculated internal signature with a user provided signature to generate an enable signal allowing access to a test mode of the array of memory cells. The disclosure also relates to a System-on-Chip (SoC) component comprising a memory device as well as to a method for managing access to a memory array into a test mode.
1-26. (canceled)
A memory device, comprising:
A method for managing access to a memory array, comprising:
A system, comprising:
Dependencies are inferred from the claim text.