Systems and methods for use in handling components
AssigneeElectro Scientific Industries, Inc.
InventorsDouglas Garcia, Madhan Pachiyappan, Deenadayala Choundappan
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AssigneeElectro Scientific Industries, Inc.
InventorsDouglas Garcia, Madhan Pachiyappan, Deenadayala Choundappan
Estimating the term…
An electrical component testing apparatus can include a vacuum plate including a first surface, a second surface opposite the first surface, and through-holes extending through the vacuum plate from the first surface to the second surface. The apparatus also includes a manifold arranged at the second surface of the vacuum plate. The manifold can include a manifold body and passageways extending within the manifold body, wherein each of the passageways includes a first end and a second end. The first end includes an opening that intersects an exterior of the manifold body at a first location corresponding to a location of a through-hole in the vacuum plate and the second end includes an opening that intersects an exterior of the manifold body at a second location. The apparatus can also include a source of pressurized air coupled to the opening of the second end.
An electrical component testing apparatus, comprising:
A decelerator for an electrical component testing apparatus having a tube assembly with a first end and a second end opposite the first end, wherein the second end is lower than the first end, wherein the first end is configured to receive a plurality of electrical components and the tube assembly is configured such that received electrical components can travel therethrough along a path of travel, the decelerator comprising:
Dependencies are inferred from the claim text.