Strain gauge having unbalanced bias for single sided applications

A method of measuring strain on a substrate due to force applied to the substrate, the method comprising:

• applying a supply voltage and a ground voltage across a pair of parallel connected Wheatstone bridge resistor arrangements, a first of the pair of Wheatstone bridge resistor arrangements being disposed on a first surface of the substrate;
• applying the force to the substrate;
• and
• measuring a differential voltage across output nodes of the pair of parallel connected Wheatstone bridge resistor arrangements present because the resistors of the first of the pair of Wheatstone bridge arrangements are equal in resistance while some of the resistors of a second of the pair of Wheatstone bridge arrangements are unequal in resistance.

An electronic device, comprising:

• a substrate;
• a first Wheatstone bridge arrangement of resistors disposed on a first surface of the substrate, the resistors of the first Wheatstone bridge arrangement being equal in resistance;
• and
• a second Wheatstone bridge arrangement of resistors disposed on a component remotely located from the substrate, some of the resistors of the second Wheatstone bridge arrangement being unequal in resistance to one another, and being unequal in resistance to the resistors of the first Wheatstone bridge arrangement of resistors;
• wherein the first Wheatstone bridge arrangement of resistors are electrically connected in parallel with the second Wheatstone bridge arrangement of resistors such that each resistor of the first Wheatstone bridge arrangement is electrically connected in parallel with a different resistor of the second Wheatstone bridge arrangement.