Inspection method of examination system and examination system
AssigneeNHK Spring Co., Ltd.
InventorEijiro FURUTA
Life of this patent
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Abstract
An inspection method to be used to inspect an examination system configured to image an object and make a good/defective determination of the object on the basis of an image acquired by the imaging comprises displaying a sample image of the object, imaging the displayed sample image by a camera, and making a good/defective determination of the object indicated by the sample image on the basis of the image acquired by imaging of the camera.
Claims8
An inspection method to be used to inspect an examination system configured to image an object and make a good/defective determination of the object on the basis of an image acquired by the imaging comprising:
- displaying a sample image of the object;
- imaging the displayed sample image by a camera;
- and
- making a good/defective determination of the object indicated by the sample image on the basis of the image acquired by imaging of the camera.
An examination system configured to image an object and make a good/defective determination of the object on the basis of an image acquired by the imaging comprising:
- a display device configured to display an image;
- an imaging device including a camera configured to image the object;
- and
- a control device configured to control the display device and the imaging device, wherein
- the control device makes the display device display a sample image of the object, makes the camera image the sample image displayed on the display device, and makes a good/defective determination of the object indicated by the sample image on the basis of the image acquired by imaging of the camera.
Dependencies are inferred from the claim text.