Probe fitting structure and probe
AssigneeMurata Manufacturing Co., Ltd.
InventorShinichi KENZAKI
Life of this patent
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AssigneeMurata Manufacturing Co., Ltd.
InventorShinichi KENZAKI
Estimating the term…
A probe fitting structure includes a connector to be inspected and a probe capable of being fitted to the connector. The connector includes a plurality of connection electrodes. The probe includes a flange having a through hole and used for attaching the probe to a device, a coaxial cable extending through the through hole and including a leading end portion to which a probe pin is attached, a plunger including a leading end through which the probe pin is exposed, and a spring housing the coaxial cable between the flange and the plunger and including a first end portion fixed to the flange and a second end portion fixed to the plunger. The plunger includes a plunger-side fitting portion in a leading end portion of the plunger. The connector includes a connector-side fitting portion (opening portion) capable of being fitted to the plunger-side fitting portion.
A probe fitting structure comprising:
A probe fitting structure comprising:
A probe for inspecting a connector including a connection electrode, the probe comprising:
Dependencies are inferred from the claim text.