Identifying one or more acquisitions of interest using visual qualification
AssigneeTektronix, Inc.
InventorsGary J. Waldo, Pierre Dupont
Life of this patent
Estimating the term…
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AssigneeTektronix, Inc.
InventorsGary J. Waldo, Pierre Dupont
Estimating the term…
A test and measurement instrument having an input configured to acquire waveforms from a device under test, a memory configured to store the acquired waveforms, a user input configured to receive a selection, and one or more processors. The one or more processors can render on a display the acquired waveforms, receive the selection from the user input indicating a filter criterium, such as a region of interest in the displayed acquired waveforms, determine which waveforms of the acquired waveforms are within the region of interest, and render only waveforms associated with the region of interest on the display.
A test and measurement instrument, comprising:
A method for selectively displaying acquired waveforms, comprising:
One or more non-transitory computer-readable storage media comprising instructions, which, when executed by one or more processors of a test and measurement instrument, cause the test and measurement instrument to:
Dependencies are inferred from the claim text.