Shift detection method and analyzer pipeline
AssigneeShenzhen Mindray Bio-Medical Electronics Co., Ltd.
InventorsXiansuan DU, Lijian Hu
Life of this patent
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Abstract
A test tube rack of an analyzer pipeline includes multiple test tube holders for holding test tubes. The test tube rack of an analyzer pipeline comprises a light blocker configured at a side wall of the test tube rack and across multiple test tube holders. A second feature area is on the light blocker between two adjacent test tube holders, a first feature area is between two adjacent second feature areas and a step gap with a predetermined depth is between the first feature area and a second feature area.
Claims20
A shift detection method implemented by using a test tube rack, wherein a light blocker arranged on a surface of the test tube rack, the light blocker comprises a first feature area and a second feature area for blocking the test tubes, the second feature area having a depth different from the first feature area in a direction perpendicular to the surface of the test tube rack, the shift detection method comprising:
- acquiring a reflected signal from the first feature area and the second feature area of the light blocker to output a detection signal during a shifting process of the test tube rack, a single test tube is shifted during the shifting process of the test tube rack, and acquiring a stop voltage from the detection signal when the single shifting process stops and a limit voltage during the shifting process;
- and the limit voltage is the maximum absolute value of voltage from the beginning to the end of the shift of the test tube rack;
- and
- determining whether a ratio of the limit voltage and the stop voltage satisfies a first condition, if the first condition is satisfied, the shifting process of the test tube rack is determined as correct, otherwise, the shifting process of the test tube rack is determined as false.
An analyzer pipeline system, comprising:
- an analyzer for testing samples in test tubes;
- a test tube rack including a plurality of test tube holders for holding the test tubes;
- a drive component for driving the test tube rack;
- a light blocker arranged on a surface of the test tube rack, the light blocker comprises a first feature area and a second feature area alternated with the first feature area, the first feature area and the second feature area optically blocking the test tubes, the second feature area having a depth different from the first feature area in a direction perpendicular to the surface of the test tube rack;
- a sensor for detecting a reflected signal from the first feature area and the second feature area of the light blocker to output a detection signal during a shifting process of the test tube rack by the drive component, a single test tube is shifted during the shifting process of the test tube rack;
- a processor configured to acquire a stop voltage from the detection signal and a limit voltage from the detection signal during the shifting process, wherein the stop voltage is detected upon the test tube rack ending the shift, and the limit voltage is the maximum absolute value of voltage from the beginning to the end of the shift of the test tube rack;
- and the processor is further configured to determine whether a ratio of the limit voltage and the stop voltage satisfies a first condition;
- upon the determination that the first condition is satisfied, the shifting process of the test tube rack is determined as correct;
- otherwise, the shifting process of the test tube rack is determined as false.
Dependencies are inferred from the claim text.