X-ray imaging method and system thereof
AssigneeDelta Electronics, Inc.
InventorsSih-Yu CHEN, Jhih-Shian LEE
Life of this patent
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Abstract
An X-ray imaging method includes the following steps: (a) performing a first object imaging and obtaining a first object intensity signal by detecting an X-ray passing through a first object; (b) performing baseline imaging process, obtaining a baseline intensity signal by detecting the X-ray when the first object is not in a FOV; and; (c) obtaining the first thickness of the first object by performing operations on the first object intensity signal, the baseline intensity signal, and the first attenuation coefficient of the first object.
Claims17
An X-ray imaging method, comprising:
- (a) performing a first object imaging process to obtain a first object intensity signal by detecting a plurality of X-rays of a X-ray source passing through a first object in an field of view (FOV);
- (b) performing a baseline imaging process to obtain a baseline intensity signal by detecting the X-rays when the first object is not in the FOV;
- and;
- (c) obtaining a first thickness of the first object based on the first object intensity signal, the baseline intensity signal, and a first attenuation coefficient of the first object.
An X-ray imaging method, comprising:
- (a) performing a first object imaging process to obtain a first object intensity signal by detecting a plurality of X-rays passing through a first object in an field of view (FOV);
- (b) performing a baseline imaging process to obtain a baseline intensity signal by detecting the X-rays when the first object is not in the FOV;
- (c) performing a second object imaging process to obtain a second object intensity signal by detecting the X-rays passing through a second object in the FOV;
- (d) obtaining a sample intensity signal based on the first object intensity signal and the second object intensity signal, wherein the first object is a carrier, and the second object comprises a sample and the carrier;
- and
- (e) obtaining a sample thickness based on the sample intensity signal, the baseline intensity signal and a sample attenuation coefficient.
An X-ray imaging system, comprising:
- an X-ray source, configured to perform a first object imaging process so that a plurality of X-rays pass through a first object placed in a field of view (FOV) and perform a baseline imaging process as the first object is not in the FOV;
- a detector, configured to detect the X-rays to obtain a baseline intensity signal in the baseline imaging process and obtain a first object intensity signal in the first object imaging process;
- and
- a processor, coupled to the detector;
- wherein the processor is configured to operate instructions, comprising:
- calculating a first thickness of the first object based on the first object intensity signal, the baseline intensity signal, and a first attenuation coefficient of the first object.
Dependencies are inferred from the claim text.