Determination method, imprint method, imprint apparatus, article manufacturing method and non-transitory storage medium
AssigneeCanon Kabushiki Kaisha
InventorTakahiro Sato
Life of this patent
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AssigneeCanon Kabushiki Kaisha
InventorTakahiro Sato
Estimating the term…
The present invention provides a determination method of determining a drop pattern indicating a layout of droplets of an imprint material to be arranged on a substrate and used in an imprint apparatus which forms a pattern of the imprint material on the substrate by using a mold, the method including obtaining a contact start position at which the mold comes first into contact with the imprint material in a partial shot region on the substrate based on a posture of the mold, and determining a drop pattern in the partial shot region so as to arrange droplets of the imprint material at a plurality of positions respectively located along a plurality of different radiation directions from the contact start position, with the obtained contact start position serving as a starting point.
A determination method of determining a drop pattern indicating a layout of droplets of an imprint material to be arranged on a substrate and used in an imprint apparatus which forms a pattern of the imprint material on the substrate by using a mold, the method comprising:
An imprint method of forming a pattern of an imprint material on a substrate by using a mold, the method comprising:
An imprint apparatus which forms a pattern of an imprint material on a substrate by using a mold, the apparatus comprising:
A non-transitory storage medium storing a program for causing a computer to execute a determination method of determining a drop pattern indicating a layout of droplets of an imprint material to be arranged on a substrate and used in an imprint apparatus which forms a pattern of the imprint material on the substrate by using a mold, the method comprising:
Dependencies are inferred from the claim text.