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US 2021/0260067 A1Published application
Heterocyclic compounds, preparation methods and uses thereof
AssigneeInventisbio Co., Ltd.
InventorsXing Dai, Yueheng Jiang, Yanqin Liu
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Abstract
Provided herein are compounds, crystalline forms, and pharmaceutical compositions of Compound 1 and/or Compound 2. Also provided are methods of treating a disease or disorder such as a cancer or infectious disease that comprises administering to a subject in need thereof one or more of the compounds or compositions of the present disclosure.
Claims29
A crystalline form of a compound having the following formula:
- wherein the crystalline form is Form I, Form II, Form III, or Form IV,
- wherein crystalline Form I is characterized by an X-ray powder diffraction (XRPD) pattern having one or more of the following peaks:
- 6.9, 11.4, 11.5, 13.0, 14.8, 17.4, 17.8, 18.1, 19.4, and 22.8 degrees 2 theta, ±0.2°;
- Form II is characterized by an X-ray powder diffraction (XRPD) pattern having one or more of the following peaks:
- 8.1, 15.6, and 18.8 degrees 2 theta, ±0.2°;
- Form III is characterized by an X-ray powder diffraction (XRPD) pattern having one or more of the following peaks:
- 6.6, 8.3, 11.5, 19.1, 19.9, and 22.0 degrees 2 theta, ±0.2°;
- and Form IV is characterized by an X-ray powder diffraction (XRPD) pattern having one or more of the following peaks:
- 6.7, 8.6, 16.6, 18.9, and 19.2 degrees 2 theta, ±0.2°.
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A crystalline form of a compound having the following formula:
- wherein the crystalline form is crystalline Form A, Form B, Form C, or Form D, wherein the crystalline Form A is characterized by an X-ray powder diffraction (XRPD) pattern having one or more of the following peaks:
- 6.2, 12.6, 14.8, and 19.9 degrees 2 theta, ±0.2°;
- Form B is characterized by an X-ray powder diffraction (XRPD) pattern having one or more of the following peaks:
- 6.2, 12.6, 14.8, 19.0, and 19.8 degrees 2 theta, ±0.2°;
- Form C is characterized by an X-ray powder diffraction (XRPD) pattern having one or more of the following peaks:
- 6.2, 12.5, and 19.9 degrees 2 theta, ±0.2°;
- and Form D is characterized by an X-ray powder diffraction (XRPD) pattern having one or more of the following peaks:
- 5.6, 11.2, 16.9, and 22.6 degrees 2 theta, ±0.2°.
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Dependencies are inferred from the claim text.