Spatial monitoring and control of plasma processing environments
AssigneeAdvanced Energy Industries, Inc.
InventorsDaniel Carter, Kevin Fairbairn, Denis Shaw, Victor Brouk
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AssigneeAdvanced Energy Industries, Inc.
InventorsDaniel Carter, Kevin Fairbairn, Denis Shaw, Victor Brouk
Estimating the term…
Systems and methods for plasma processing are disclosed. An exemplary system may include a plasma processing chamber comprising a source to produce a plasma in the processing chamber and at least two bias electrodes arranged within the plasma processing chamber to control plasma sheaths proximate to the bias electrodes. A chuck is disposed to support a substrate, and a source generator is coupled to the plasma electrode. At least one bias supply is coupled to the at least two bias electrodes, and a controller is included to control the at least one bias supply to control the plasma sheaths proximate to the bias electrodes.
A method for plasma processing, the method comprising:
A non-transitory computer-readable medium comprising instructions stored thereon, for at least one of execution by a processor or for configuring a field programmable gate array, to perform plasma processing, the instructions comprising instructions to:
A system for controlling a plasma in a processing chamber, the system comprising:
Dependencies are inferred from the claim text.