Method and apparatus for detecting abnormality of manufacturing facility

A manufacturing facility abnormality detection apparatus comprising:

• a processor;
• wherein the processor is configured to receive a measured value for a current state of a manufacturing facility measured through a multi-sensor on a time-by-time basis, acquire an output value for each time by inputting the measured value to a learning model for manufacturing facility abnormality detection, determine whether a proportion of an output value exceeding a threshold of the learning model satisfies a determination criterion of the learning model by comparing the output values to the threshold during a local window of the learning model, and determine that the manufacturing facility is abnormal when the determination criterion is not satisfied.

The manufacturing facility abnormality detection apparatus of claim 15, wherein the processor is configured to determine whether the determination criterion of the learning model is satisfied based on a relationship between output values exceeding the threshold during the local window of the learning model.

The manufacturing facility abnormality detection apparatus of claim 15, wherein when the manufacturing facility is determined to be abnormal, the processor is configured to switch a control mode of the manufacturing facility to a server control mode controlled by a server or an Internet of things (IoT) terminal control mode controlled by an IoT terminal that performs a manufacturing facility abnormal detection method, based on predetermined control mode setting information.

The manufacturing facility abnormality detection apparatus of claim 15, wherein when the manufacturing facility is determined to be abnormal, the processor is configured to determine a cause of an occurrence of an abnormality in the manufacturing facility through a comparison between the measured value and the threshold and record information on the cause.

The manufacturing facility abnormality detection apparatus of claim 15, wherein when the manufacturing facility is determined to be abnormal, the processor is configured to report a current state of the manufacturing facility to an operator of the manufacturing facility.