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US 2021/0239640 A1Published application
Temperature-corrected control data for verifying of structural integrity of materials
Assignee3M Innovative Properties Company
InventorDavid H. Redinger
Life of this patent
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Abstract
The disclosure describes techniques for detecting a crack or defect in a material.
Claims20
A system comprising:
- a computing device configured to:
- determine a temperature-scaled control data set based on a measurement temperature associated with a measurement data set, wherein the measurement data set is associated with a tested material and comprises a plurality of values representative of electrical parameters of the tested material;
- generate comparisons of respective values of the measurement data set to corresponding respective values of the temperature-scaled control data set;
- and
- determine whether the tested material includes a defect based on the comparisons.
2 more elements
A computer readable storage medium comprising instructions that, when executed, cause a computing device to:
- determine a temperature-scaled control data set based on a measurement temperature associated with a measurement data set, wherein the measurement data set is associated with a tested material and comprises a plurality of values representative of electrical parameters of the tested material;
- generate comparisons of respective values of the measurement data set to corresponding respective values of the temperature-scaled control data set;
- and
- determine whether the tested material includes a defect based on the comparisons.
1 more element
Dependencies are inferred from the claim text.