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US 2021/0239628 A1Published application
Backscatter X-ray System
AssigneeShenzhen Xpectvision Technology Co., Ltd.
InventorsPeiyan CAO, Yurun LIU
Life of this patent
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Abstract
Disclosed herein is a backscatter X-ray system comprising: an X-ray source configured to scan a sheet of X-ray across an object, wherein the sheet of X-ray illuminates one line on a surface of the object; a sensor configured to differentiate backscattered X-ray from different spots along the line.
Claims19
A system comprising:
- an X-ray source configured to scan a sheet of X-ray across an object, wherein the sheet of X-ray illuminates one line on a surface of the object;
- a sensor configured to differentiate backscattered X-ray from different spots along the line.
Dependencies are inferred from the claim text.