Displacement amount measuring device, displacement amount measuring method, and recording medium
AssigneeNEC Corporation
InventorHiroshi IMAI
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AssigneeNEC Corporation
InventorHiroshi IMAI
Estimating the term…
The objective of the present invention is to detect defects in a structure accurately in a non-contact manner. An optical path length converting unit (320) is disposed between a specimen being inspected and an image capturing element (310) in such a way as to cover part of a field of view of the image capturing element (310). An image analyzing unit (330) uses images captured by the image capturing element (310) to calculate amounts of displacement within the surface of the specimen, obtained using two fields of view of the image capturing element (310) not covered/covered by the optical path length converting unit (320). An out-of-plane displacement calculating unit (340) calculates an out-of-plane displacement of the specimen on the basis of the calculated amounts of displacement.
A displacement amount measuring device comprising:
A displacement amount measuring method performed by using a device including an image capturing element that captures an image of a surface of a specimen and optical path length converting material being disposed between the specimen and the image capturing element in such a way as to cover a part of a field of view of the image capturing element, the displacement amount measuring method comprising:
A non-transitory recording medium that stores a program for causing a computer to execute processing, the processing comprising:
Dependencies are inferred from the claim text.